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| University: | DE | |
| Institute, faculty: | Faculty of Science | |
| Department(s): | Department of Solid State Physics | |
| Name of course : | Atomic Resolution Microscopy | |
| Name of responsible: | Dr Szabó István | |
| E-mail: | iaszabo@tigris.klte.hu | |
| Name of teachers: | Dr Szabó István Dr Cserháti Csaba |
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| Course programme: | Introduction: Limits of microscopy, basic techniques, basics of surface physics and UHV, image formation and processing Field Ion Microscopy: basics, atomprobe, imaging atomprobe, application examples. Scanning Tunnelling Microscopy: The first realisation, the tunnelling process, vibration damping, piezo-electricity, control electronics, examples, image interpretation, applications. Atomic force microscopy: The basic idea, modes of force detection, modes of operation, mechanisms of the tip sample interaction, examples. Near-field Optical Microscopy: Overcoming the wavelength limit. Realisation techniques, applications. Scanning Probe Microscopy: The local probe method: main types, applications. High resolution electron microscopy: Transmission and scanning transmission techniques, electron holography, the theory of image formation, resolution limits, HR-image simulation.
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| Grade: | Ph.D |
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| Type: | lecture |
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Labelled in education: |
kötelezően választható | |
Name of lecture notes or books (if any): |
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Number of credits: |
3 | |