Formation of layers by molecular beam epitaxy. Multilayers. Formation of multilayers by magnetron sputtering. Structure evolution in polycrystalline films.Structure of multilayers. Amorphisation in multilayers. Investigation of multilayers by X-ray diffraction. Al-metal interaction in thin films. Investigation of thin films by Mössbauer-spectroscopy. Formation of metastable layers by ion-implantation . Structure of layers in semiconductor materials. Depth sensitive measurement by low energy positrons . Ion-mixing during the ion-sputtering. Investigation of thin films by ions. Investigation of multilayers by magnetic X-ray dichroism.
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